MIPS/LD/testsuite: Switch mips16-hilo tests to new disassembly format
Switch the o32 and n32 mips16-hilo MIPS LD tests to the new disassembly
format, to reduce discrepancies in output in preparation to reuse for
generic linker tests.
Taking the first line of disassembly output as an example the difference
is:
00500000 <stuff> 6c00 li a0,0
vs:
0x0000000000500000 6c00 li a0,0
for ELF and srec input respectively with the currently used older format
requested with `--prefix-addresses', but with the new disassembly format
it is exactly the same between the two input formats and no information
that we need is lost in the transition:
500000: 6c00 li a0,0
2 files changed
