| /* { dg-do compile } */ |
| /* { dg-options "-O2 -fdump-tree-reassoc1 -fno-ipa-icf" } */ |
| |
| /* We want to make sure that we reassociate in a way that has the |
| constant last. With the constant last, it's more likely to result |
| in a bitfield test on targets with such capabilities. */ |
| |
| extern void boo (); |
| |
| int b2b_uc (unsigned char u, unsigned char w) |
| { |
| if ((u & w) & 0x20) |
| boo (); |
| } |
| |
| int b2b_us (unsigned short u, unsigned short w) |
| { |
| if ((u & w) & 0x20) |
| boo (); |
| } |
| |
| int b2b_ui (unsigned int u, unsigned int w) |
| { |
| if ((u & w) & 0x20) |
| boo (); |
| } |
| int b2b_ul (unsigned long u, unsigned long w) |
| { |
| if ((u & w) & 0x20) |
| boo (); |
| } |
| int b2b_ull (unsigned long long u, unsigned long long w) |
| { |
| if ((u & w) & 0x20) |
| boo (); |
| } |
| |
| int b2b_sc (signed char u, signed char w) |
| { |
| if ((u & w) & 0x20) |
| boo (); |
| } |
| |
| int b2b_ss (signed short u, signed short w) |
| { |
| if ((u & w) & 0x20) |
| boo (); |
| } |
| |
| int b2b_si (signed int u, signed int w) |
| { |
| if ((u & w) & 0x20) |
| boo (); |
| } |
| int b2b_sl (signed long u, signed long w) |
| { |
| if ((u & w) & 0x20) |
| boo (); |
| } |
| int b2b_sll (signed long long u, signed long long w) |
| { |
| if ((u & w) & 0x20) |
| boo (); |
| } |
| |
| /* The AND of U & W should go into a temporary, when is then ANDed |
| with the constant. |
| |
| First verify that we have the right number of ANDs between U and W. */ |
| /* { dg-final { scan-tree-dump-times "\[uw\]_\[0-9\]+.D. \& \[uw\]_\[0-9\]+.D.;" 10 "reassoc1"} } */ |
| |
| /* Then verify that we have the right number of ANDS between a temporary |
| and the constant. */ |
| /* { dg-final { scan-tree-dump-times "_\[0-9]+ \& 32;" 10 "reassoc1"} } */ |
| |
| /* Each function has one AND. It will have either a second AND or TEST. So |
| we can count the number of AND and TEST instructions. They must be 2X |
| the number of test functions in this file. */ |
| /* { dg-final { scan-assembler-times "and|test" 20 { target { i?86-*-* x86_64-*-*} } } } */ |
| |
| /* Similarly on the m68k. The code for the long long tests is suboptimal, |
| which catch via the second pattern and xfail. */ |
| /* { dg-final { scan-assembler-times "and|btst" 20 { target { m68k-*-* } } } } */ |
| /* { dg-final { scan-assembler-not "or" { target { m68k-*-* } xfail { *-*-* } } } } */ |
| |
