| /* { dg-do assemble { target aarch64_asm_sve_ok } } */ |
| /* { dg-options "-O2 -ftree-vectorize --save-temps" } */ |
| |
| #include <stdint.h> |
| |
| #ifndef INDEX8 |
| #define INDEX8 int8_t |
| #define INDEX16 int16_t |
| #define INDEX32 int32_t |
| #define INDEX64 int64_t |
| #endif |
| |
| #define TEST_LOOP(DATA_TYPE, BITS) \ |
| void __attribute__ ((noinline, noclone)) \ |
| f_##DATA_TYPE##_##BITS (DATA_TYPE *restrict dest, \ |
| DATA_TYPE *restrict src, \ |
| INDEX##BITS stride, INDEX##BITS n) \ |
| { \ |
| for (INDEX##BITS i = 0; i < n; ++i) \ |
| dest[i * stride] = src[i] + 1; \ |
| } |
| |
| #define TEST_TYPE(T, DATA_TYPE) \ |
| T (DATA_TYPE, 8) \ |
| T (DATA_TYPE, 16) \ |
| T (DATA_TYPE, 32) \ |
| T (DATA_TYPE, 64) |
| |
| #define TEST_ALL(T) \ |
| TEST_TYPE (T, int32_t) \ |
| TEST_TYPE (T, uint32_t) \ |
| TEST_TYPE (T, float) \ |
| TEST_TYPE (T, int64_t) \ |
| TEST_TYPE (T, uint64_t) \ |
| TEST_TYPE (T, double) |
| |
| TEST_ALL (TEST_LOOP) |
| |
| /* { dg-final { scan-assembler-times {\tst1w\tz[0-9]+\.s, p[0-7], \[x[0-9]+, z[0-9]+.s, sxtw 2\]\n} 9 } } */ |
| /* { dg-final { scan-assembler-times {\tst1d\tz[0-9]+\.d, p[0-7], \[x[0-9]+, z[0-9]+.d, lsl 3\]\n} 12 } } */ |