| /* { dg-do assemble { target aarch64_asm_sve_ok } } */ |
| /* { dg-options "-O2 -ftree-vectorize --save-temps" } */ |
| |
| #include <stdint.h> |
| |
| #define TEST_LOOP(DATA_TYPE, NAME, SCALE) \ |
| void __attribute__ ((noinline, noclone)) \ |
| f_##DATA_TYPE##_##NAME (DATA_TYPE *restrict dest, \ |
| DATA_TYPE *restrict src) \ |
| { \ |
| for (long i = 0; i < 1000; ++i) \ |
| dest[i] += src[i * SCALE]; \ |
| } |
| |
| #define TEST_TYPE(T, DATA_TYPE) \ |
| T (DATA_TYPE, 5, 5) \ |
| T (DATA_TYPE, 7, 7) \ |
| T (DATA_TYPE, 11, 11) \ |
| T (DATA_TYPE, 200, 200) \ |
| T (DATA_TYPE, m100, -100) |
| |
| #define TEST_ALL(T) \ |
| TEST_TYPE (T, int32_t) \ |
| TEST_TYPE (T, uint32_t) \ |
| TEST_TYPE (T, float) \ |
| TEST_TYPE (T, int64_t) \ |
| TEST_TYPE (T, uint64_t) \ |
| TEST_TYPE (T, double) |
| |
| TEST_ALL (TEST_LOOP) |
| |
| /* { dg-final { scan-assembler-times {\tld1w\tz[0-9]+\.s, p[0-7]/z, \[x[0-9]+, z[0-9]+.s, uxtw\]\n} 12 } } */ |
| /* { dg-final { scan-assembler-times {\tld1w\tz[0-9]+\.s, p[0-7]/z, \[x[0-9]+, z[0-9]+.s, sxtw\]\n} 3 } } */ |
| /* { dg-final { scan-assembler-times {\tld1d\tz[0-9]+\.d, p[0-7]/z, \[x[0-9]+, z[0-9]+.d\]\n} 15 } } */ |