gcc/testsuite/gcc.target/aarch64/sve/scatter_store_5.c

/* { dg-do assemble { target aarch64_asm_sve_ok } } */
/* { dg-options "-O2 -ftree-vectorize --save-temps" } */

#include <stdint.h>

#define TEST_LOOP(DATA_TYPE)						\
  void __attribute__ ((noinline, noclone))				\
  f_##DATA_TYPE (DATA_TYPE *restrict *dest, DATA_TYPE *restrict src,	\
		 int n)							\
  {									\
    for (int i = 0; i < n; ++i)						\
      *dest[i] = src[i] + 1;						\
  }

#define TEST_ALL(T)				\
  T (int8_t)					\
  T (uint8_t)					\
  T (int16_t)					\
  T (uint16_t)					\
  T (int32_t)					\
  T (uint32_t)					\
  T (int64_t)					\
  T (uint64_t)					\
  T (double)

TEST_ALL (TEST_LOOP)

/* We assume this isn't profitable for bytes.  */
/* { dg-final { scan-assembler-times {\tst1h\tz[0-9]+\.d, p[0-7], \[z[0-9]+.d\]\n} 2 } } */
/* { dg-final { scan-assembler-times {\tst1w\tz[0-9]+\.d, p[0-7], \[z[0-9]+.d\]\n} 2 } } */
/* { dg-final { scan-assembler-times {\tst1d\tz[0-9]+\.d, p[0-7], \[z[0-9]+.d\]\n} 3 } } */